Co-based amorphous thin films on silicon with soft magnetic properties

被引:18
|
作者
Masood, Ansar [1 ]
McCloskey, P. [1 ]
Mathuna, Cian O. [1 ,2 ]
Kulkarni, S. [1 ]
机构
[1] Univ Coll Cork, Tyndall Natl Inst, Microsyst Ctr, Cork, Ireland
[2] Univ Coll Cork, Sch Elect & Elect Engn, Cork, Ireland
基金
爱尔兰科学基金会;
关键词
RESONANCE;
D O I
10.1063/1.5007733
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (>= 333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films. (C) 2017 Author(s).
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页数:5
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