Different growth modes of Au films on ZnO(0001)

被引:4
|
作者
Ay, M. [1 ]
Nefedov, A.
Zabel, H.
机构
[1] ETH, Neutron Scattering Lab, CH-5232 Villigen, Switzerland
[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[3] Ruhr Univ Bochum, Inst Expt Phys Festkorperphys, D-44780 Bochum, Germany
关键词
metal-oxide interface; X-ray scattering; X-ray photoemission spectroscopy; Volmer-Weber growth mode; layer-by-layer growth mode;
D O I
10.1016/j.susc.2006.08.040
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth properties of gold films sputtered at room temperature (RT) and at 550 degrees C on O-terminated ZnO(0001)/Al2O3(1120) substrates were investigated by X-ray scattering, atomic force microscopy and by scanning electron microscopy. A maximal lattice mismatch of about 1.21% and 0.5% has been found in the growth direction for samples grown at 550 degrees C and RT, respectively. The chemical composition was determined by X-ray photoemission spectroscopy, which revealed a completely covered ZnO(0001) surface by Au after sputtering at RT. In addition, these measurements show that Au grows layer-by-layer at RT, but forms clusters if sputtered at 550 degrees C (Volmer-Weber growth mode). (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:5062 / 5067
页数:6
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