High-efficiency diffractive beam splitters surface-structured on submicrometer scale using deep-UV interference lithography

被引:9
作者
Amako, Jun [1 ]
Sawaki, Daisuke [1 ]
Fujii, Eiichi [1 ]
机构
[1] Seiko Epson Corp, Nagano 3928502, Japan
关键词
RELIEF GRATINGS; OPTICAL-ELEMENTS;
D O I
10.1364/AO.48.005105
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report highly efficient diffractive beam splitters intended for high-power laser applications. Submicron relief structures that work as an antireflective layer are formed on the surfaces of a splitter to improve its transmitted efficiency. Surface structuring is performed using deep-UV interference lithography and reactive ion etching. As immersed in an index-matching liquid, the resist layer coated on diffractive surfaces is exposed to the interference fringes that are set intersecting the grooves on the surfaces. Rigorously designed structures with a period of 140 nm and a depth of 55 nm are lithographed onto fused-silica splitters. Splitting efficiencies at 266 nm are increased by 8% to compare favorably with a theoretical value, while Fresnel reflections are considerably reduced. (C) 2009 Optical Society of America
引用
收藏
页码:5105 / 5113
页数:9
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