Design and Implementation of Software System of E-beam Lithography Based on SEM

被引:1
作者
Wei, Shuhua [1 ]
Zhang, Jinzhao [2 ]
Han, Li [2 ]
机构
[1] North China Univ Technol, Coll Informat Engn, Ctr Microelect, Beijing, Peoples R China
[2] Chinese Acad Sci, Inst Elect Engn, Beijing, Peoples R China
来源
2009 4TH IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1 AND 2 | 2009年
关键词
Micro-nanofabrication; Electron Beam Lithography; Control Software System; Layout Design; Overlay;
D O I
10.1109/NEMS.2009.5068639
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a newly developed software system for electron beam lithography based on SEM is introduced. This software system consists of exposure layout processing functional module, alignment control functional module and exposure control functional module. It can accomplish the microlithography and micro-nanofabrication layouts design, generate the exposure data riles, detect and correct the hardware, and control the whole process of exposure. Furthermore, the software system can be used in various electron beam lithography systems based on scanning electron microscope (SEM) with its powerful functions and friendly manipulation. The software system plays an important role in the electron beam lithography system based on SEM.
引用
收藏
页码:547 / +
页数:2
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