A History of Vacuum Generators' 100-kV Scanning Transmission Electron Microscope

被引:7
|
作者
Wardell, Ian R. M. [1 ]
Bovey, Peter E. [1 ]
机构
[1] Univ Sussex, Dept Phys & Astron, Brighton, E Sussex, England
关键词
ENERGY-LOSS SPECTROSCOPY; DESIGN CONSIDERATIONS; RESOLUTION; STEM; PERFORMANCE; SPECTROMETER; DIFFRACTION; SURFACE; SYSTEM;
D O I
10.1016/S1076-5670(09)59006-4
中图分类号
O59 [应用物理学];
学科分类号
摘要
Vacuum Generators, a company created in the UK in 1962 to meet the growing demand for ultra high vacuum equipment, entered the scanning transmission electron microscope market in 1971. A history of their development of a 100-kV STEM is chronicled from 1971 until their final microscope was delivered in 1996. © 2009 Elsevier Inc. All rights reserved.
引用
收藏
页码:221 / 285
页数:65
相关论文
共 50 条
  • [21] ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    TOMITA, T
    ITO, T
    KOBAYASHI, H
    KATO, S
    DAIMON, H
    KOKUBO, Y
    HARADA, Y
    INO, S
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 298 - 298
  • [22] Effect of temperature on beam damage of asbestos fibers in the transmission electron microscope (TEM) at 100 kV
    Martin, Joannie
    Beauparlant, Martin
    Sauve, Sebastien
    L'Esperance, Gilles
    MICRON, 2017, 94 : 26 - 36
  • [23] On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope
    Sun, Cheng
    Mueller, Erich
    Meffert, Matthias
    Gerthsen, Dagmar
    MICROSCOPY AND MICROANALYSIS, 2018, 24 (02) : 99 - 106
  • [24] USE OF 100KV ELECTRON-MICROSCOPE - 100KV-1000KV COMPARISONS
    DROST, N
    ZEEDIJK, HB
    MIKROSKOPIE, 1978, 34 (5-6) : 188 - 188
  • [25] Switching of 100-kV Pulses in a Planar "Open" Discharge with Generation of Counterpropagating Electron Beams
    Bokhan, P. A.
    Gugin, P. P.
    Zakrevsky, D. E.
    Lavrukhin, M. A.
    TECHNICAL PHYSICS LETTERS, 2017, 43 (10) : 928 - 931
  • [26] Switching of 100-kV pulses in a planar “open” discharge with generation of counterpropagating electron beams
    P. A. Bokhan
    P. P. Gugin
    D. E. Zakrevsky
    M. A. Lavrukhin
    Technical Physics Letters, 2017, 43 : 928 - 931
  • [27] Direct imaging of electron density with a scanning transmission electron microscope
    Ondrej Dyck
    Jawaher Almutlaq
    David Lingerfelt
    Jacob L. Swett
    Mark P. Oxley
    Bevin Huang
    Andrew R. Lupini
    Dirk Englund
    Stephen Jesse
    Nature Communications, 14
  • [29] Direct imaging of electron density with a scanning transmission electron microscope
    Dyck, Ondrej
    Almutlaq, Jawaher
    Lingerfelt, David
    Swett, Jacob L.
    Oxley, Mark P.
    Huang, Bevin
    Lupini, Andrew R.
    Englund, Dirk
    Jesse, Stephen
    NATURE COMMUNICATIONS, 2023, 14 (01)
  • [30] SECONDARY ELECTRON IMAGING IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE.
    Allen, R.M.
    Scanning Electron Microscopy, 1985, v : 905 - 918