共 6 条
- [3] MECHANICAL-PROPERTIES OF THIN-FILMS [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1989, 20 (11): : 2217 - 2245
- [4] Texture and grain boundary structure dependence of Hillock formation in thin metal films [J]. MATERIALS RELIABILITY IN MICROELECTRONICS VIII, 1998, 516 : 115 - 120
- [5] Sauter L, 2005, MATER RES SOC SYMP P, V875, P177
- [6] HILLOCK RECOGNITION BY DIGITAL IMAGE-PROCESSING [J]. APPLIED SURFACE SCIENCE, 1995, 91 (1-4) : 246 - 250