The design of the sagittal focusing monochromator for XAFS measurement at NSRL

被引：0

作者：

Feng, Liangjie ^{[1
]}

Dong, Xiaohao ^{[1
]}

Kang, Le ^{[1
]}

Xu, Chaoyin ^{[1
]}

机构：

[1] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China

来源：

SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2 | 2007年 / 879卷

关键词：

sagittal focusing monochromator; flexural hinge-based bender; X-ray; synchrotron radiation;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The main project of XAFS bean-dine upgrading at NSRL is to replace the double crystal monochromator with the sagittal-focusing one, of which the diffraction and the focus are compatible. It will increase the photon intensity more than 5 times on the sample with M=1:4.88 geometry and 3x0.1 mrad(2) acceptance divergence (HxV) without other changes at the primary beamline configuration. This paper introduces concept design of the sagittal-focusing monochromator including optical design, parameters calculation, heat load analysis, mechanical analysis of the flexural hinge-based bender and the mechanism of dynamically energy scanning.

引用

页码：941 / +

页数：2