Analytical Model of Correlation Factor for Human-Body Model to Transmission-Line Pulse ESD Testing

被引：9

作者：

Lee, Jian-Hsing ^{[1
,2
]}

Iyer, Natarajan Mahadeva ^{[3
]}

机构：

[1] GLOBAL FOUNDRIES Inc, ESD, Malta, NY 12020 USA

[2] GLOBAL FOUNDRIES Inc, Latchup Dept, Malta, NY 12020 USA

[3] GLOBAL FOUNDRIES Inc, Reliabil Engn Dept, Malta, NY 12020 USA

来源：

IEEE ELECTRON DEVICE LETTERS | 2017年 / 38卷 / 07期

关键词：

Transmission-line pulse (TLP); electrostatic-discharge (ESD); human-body model (HBM);

D O I：

10.1109/LED.2017.2708420

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Physics of correlation between standard ESD testing and transmission line pulse test results on semiconductor devices using a simple resistor (R) inductor (L) capacitor (C) circuit model approach is presented. The correlation is not a constant factor, however, it can be used to evaluate the time to failure for the device during the human-body model event and is attributed to the time to induce the thermal runaway of the device during the electrostatic-discharge event.

引用

页码：952 / 954

页数：3

共 7 条

[1] Physical Model for ESD Human Body Model to Transmission Line Pulse
Lee, Jian-Hsing
Iyer, Natarajan Mahadeva
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2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
[2] Correlation of Human Metal Model and Transmission Line Pulsing Testing
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[3] A New Method to Correlate Human Body Model and Transmission Line Pulse Based on RC Thermal Equivalent Model
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[5] On-Chip Charged Device Model ESD Protection Design Method Using Very Fast Transmission Line Pulse System for RF ICs
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