Characterization of digitizer timebase jitter by means of the Allan variance

被引：16
|
作者：
Arpaia, P [1 ]
Daponte, P [1 ]
Rapuano, S [1 ]
机构：
[1] Univ Sannio, Dipartimento Ingn, I-82100 Benevento, Italy
来源：
COMPUTER STANDARDS & INTERFACES | 2003年 / 25卷 / 01期
关键词：
waveform digitizers; jitter; Allan variance; modeling; testing; diagnostics;
D O I：
10.1016/S0920-5489(02)00074-0
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A comprehensive framework for the metrological characterization of timebase jitter in waveform digitizers is proposed. With this aim, the Allan variance is shown to be a sound basis for defining a suitable figure of merit, setting up an experimental test procedure, diagnosing the jitter noise type, and modeling the jitter error. Experimental results highlighting the effectiveness of the Allan variance in the metrological characterization of digitizer jitter are discussed. (C) 2003 Elsevier Science, B.V. All rights reserved.
引用
收藏
页码：15 / 22
页数：8
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