Zn+ Implanted Silicon Waveguide Photodiodes for On-Chip Mid-Infrared Detection

被引:0
作者
Grote, Richard R. [1 ]
Souhan, Brian [1 ]
Ophir, Noam [2 ]
Driscoll, Jeffrey B. [1 ]
Bergman, Keren [2 ]
Bakhru, Hassaram [3 ]
Green, William M. J. [4 ]
Osgood, Richard M., Jr. [1 ]
机构
[1] Columbia Univ, Microelect Sci Labs, New York, NY 10027 USA
[2] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[3] SUNY Albany, Coll Nanoscale Sci & Engn, Albany, NY 12203 USA
[4] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
来源
2014 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2014年
关键词
ERROR-FREE OPERATION; MU-M;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present the first experimental demonstration of Zn+ implanted Si waveguide photodiodes for 2.2-2.4 mu m operation. Preliminary responsivities >65 mA/W are measured, suggesting suitability for on-chip sensing and communications applications in the mid-infrared.
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页数:2
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