Increasing the Q factor in the constant-excitation mode of frequency-modulation atomic force microscopy in liquid

被引:19
作者
Ebeling, D.
Hoelscher, H.
Anczykowski, B.
机构
[1] CeNTech, D-48149 Munster, Germany
[2] Univ Munster, Inst Phys, D-48149 Munster, Germany
[3] nanoAnalyt GmbH, D-48149 Munster, Germany
关键词
Atomic force microscopy - Cantilever beams - Computer simulation - Electric excitation - Frequency modulation - Indentation - Mica;
D O I
10.1063/1.2387122
中图分类号
O59 [应用物理学];
学科分类号
摘要
By adding a Q-control electronics to the setup of the constant-excitation mode of the frequency-modulation atomic force microscope, the authors are able to increase the effective Q factor of a self-oscillated cantilever in liquid to values comparable to ambient conditions. During imaging of soft biological samples adsorbed on a mica substrate, the authors observed an increased corrugation of the topography with increased Q factors. This effect is caused by the reduction of tip-sample indentation forces as demonstrated by numerical simulations and an analytical approach. (c) 2006 American Institute of Physics.
引用
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页数:3
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