Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators

被引：0

作者：

Gorur, RS ^{[1
]}

Sivasubramaniyam, S ^{[1
]}

机构：

[1] Arizona State Univ, Dept Elect Engn, Tempe, AZ 85287 USA

来源：

2002 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA | 2002年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Insulators can develop different types of defects during manufacturing, mishandling and when exposed to various atmospheric conditions while in service. The type of defects commonly obtained range from voids, improper adhesion, and cracks. Timely detection of these defects is essential to avoid power supply disruption due to insulator failure. This paper presents a study to determine if defects cause significant change in the electric field along or near the insulator surface. An attempt is needed to determine defects that do and do not cause a change in electric field.

引用

页码：319 / 322

页数：4

共 6 条

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