Imprint strategy for directed self-assembly of block copolymers

被引:3
作者
Mayer, Andre [1 ]
Blenskens, Dainel [1 ]
Rond, Johannes [1 ]
Steinberg, Christian [1 ]
Papenheim, Marc [1 ]
Wang, Si [1 ]
Zajadacz, Joachim [2 ]
Zimmer, Klaus [2 ]
Scheer, Hella-Christin [1 ]
机构
[1] Univ Wuppertal, D-42119 Wuppertal, Germany
[2] Leibniz Inst Surface Modificat, D-04318 Leipzig, Germany
关键词
Thermal nanoimprint; Block copolymers; Strategy; Directed self-assembly; THERMAL IMPRINT; LITHOGRAPHY; PATTERNS; LAMELLAE;
D O I
10.1016/j.mee.2017.02.003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The directed self-assembly (DSA) of block copolymers (BCP) has attracted high interest for the definition of nano structures in an almost self-forming way when adequate boundary conditions are given. At present, grapho- and chemo-epitaxy are the workhorses but they require precisely patterned substrates to serve as the guiding pattern. Nanoimprint may replace this laborious pre-patterning of each substrate by employing an adequate stamp that can be used multiple times, inducing the guided DSA from the top of the film. Here, the DSA of BCPs is revisited in view of the specific nanoimprint situation. As a consequence, the BCP layer is imprinted in a partial cavity-filling mode, using a stamp of sufficient height provided with a conventional anti-sticking layer; substrate pre-treatment is minimized or rather avoided. Even with a highly preferential substrate it is possible to obtain vertical lamellae that are largely oriented in parallel to the stamp edges in PS-b-PMMA (polystyrene-block-polymethyl methacrylate) already after 3 min of imprint. The vertical lamellae are at least 70 nm high, freestanding on the substrate. Though optimization is required the results indicate the high potential of nanoimprint to simplify the DSA of BCPs for technical applications, also beyond Si technology. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:94 / 100
页数:7
相关论文
共 34 条
[1]   Isoporous Block Copolymer Membranes [J].
Abetz, Volker .
MACROMOLECULAR RAPID COMMUNICATIONS, 2015, 36 (01) :10-22
[2]   Block Copolymer Lithography [J].
Bates, Christopher M. ;
Maher, Michael J. ;
Janes, Dustin W. ;
Ellison, Christopher J. ;
Willson, C. Grant .
MACROMOLECULES, 2014, 47 (01) :2-12
[3]   Polymer self assembly in semiconductor microelectronics [J].
Black, C. T. ;
Ruiz, R. ;
Breyta, G. ;
Cheng, J. Y. ;
Colburn, M. E. ;
Guarini, K. W. ;
Kim, H.-C. ;
Zhang, Y. .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2007, 51 (05) :605-633
[4]   Thermal imprint with negligibly low residual layer [J].
Bogdanski, Nicolas ;
Wissen, Matthias ;
Moellenbeck, Saskia ;
Scheer, Hella-Christin .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (06) :2998-3001
[5]   Soft-graphoepitaxy using nanoimprinted polyhedral oligomeric silsesquioxane substrates for the directed self-assembly of PS-b-PDMS [J].
Borah, Dipu ;
Simao, Claudia D. ;
Senthamaraikannan, Ramsankar ;
Rasappa, Sozaraj ;
Francone, Achille ;
Lorret, Olivier ;
Salaun, Mathieu ;
Kosmala, Barbara ;
Kehagias, Nikolaos ;
Zelsmann, Marc ;
Sotomayor-Torres, Clivia M. ;
Morris, Michael A. .
EUROPEAN POLYMER JOURNAL, 2013, 49 (11) :3512-3521
[6]  
Dealy J., 2006, STRUCTURE RHEOLOGY M
[7]   Sub-10 nm Resistless Nano lithography for Directed Self-Assembly of Block Copolymers [J].
Fernandez-Regulez, Marta ;
Evangelio, Laura ;
Lorenzoni, Matteo ;
Fraxedas, Jordi ;
Perez-Murano, Francesc .
ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (23) :21596-21602
[8]   Graphoepitaxial Assembly of Symmetric Block Copolymers on Weakly Preferential Substrates [J].
Han, Eungnak ;
Kang, Huiman ;
Liu, Chi-Chun ;
Nealey, Paul F. ;
Gopalan, Padma .
ADVANCED MATERIALS, 2010, 22 (38) :4325-4329
[9]   Nanostructured organic radical cathodes from self-assembled nitroxide-containing block copolymer thin films [J].
Hauffman, G. ;
Vlad, A. ;
Janoschka, T. ;
Schubert, U. S. ;
Gohy, J. -F. .
JOURNAL OF MATERIALS CHEMISTRY A, 2015, 3 (38) :19575-19581
[10]   Mixed lamellar films: Evolution, commensurability effects, and preferential defect formation [J].
Huang, E ;
Mansky, P ;
Russell, TP ;
Harrison, C ;
Chaikin, PM ;
Register, RA ;
Hawker, CJ ;
Mays, J .
MACROMOLECULES, 2000, 33 (01) :80-88