X-ray microscopy

被引：15
作者：
Lider, V. V. [1 ]
机构：
[1] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Leninskii Prosp 59, Moscow 119333, Russia
来源：
PHYSICS-USPEKHI | 2017年 / 60卷 / 02期
关键词：
X-rays; X-ray optics; microscopy; spectroscopy; topography; fluorescence; magnetic dichroism; FRESNEL ZONE-PLATE; FUEL-CELL ELECTRODES; PHASE-CONTRAST MODE; IN-SITU; SYNCHROTRON-RADIATION; MAGNETIC DOMAINS; COMPUTED-TOMOGRAPHY; BIOLOGICAL SAMPLES; NEXAFS MICROSCOPY; GRAIN-ORIENTATION;
D O I：
10.3367/UFNe.2016.06.037830
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
X-ray microscopy is a technique for obtaining real space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and avenues for the further development of X-ray microscopy are outlined.
引用
收藏
页码：187 / 203
页数：17
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