Characterization of resonant behavior and sensitivity using micromachined PZT cantilever

被引:17
作者
Lee, JH
Yoon, KH
Kim, TS
机构
[1] Korea Inst Sci & Technol, Microsyst Res Ctr, Seoul 130650, South Korea
[2] Yonsei Univ, Dept Ceram Engn, Seoul 120749, South Korea
关键词
piezoelectric; MEMS; cantilever; PZT; electromechanical; sensitivity;
D O I
10.1080/10584580290172071
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Micromachined piezoelectric cantilevers have been fabricated using PZT (52/58) films. Electromechanical characteristics of micromachined PZT cantilever were measured by laser vibrometer system as a function of cantilever length for the cantilever with two different supported layer thickness respectively. The 1(st) version unimorph cantilever consists of a 0.6 (square)-thick PZT layer on 1.5 (square)-thick SiN x elastic supported layer. In order to increase Q-factor in air and liquid, from calculated spring constant as a function of variable supporting layer thickness, 2(nd) version cantilever was designed to have a 0.8 (square)-thick PZT layer on 4.5 (square)-thick SiNx/Si elastic supported layer. The gravimetric sensitivities of cantilever in air were characterized by Au deposition on the backside of cantilever. The gravimetric sensitivity of 100x200 (square)-dimension cantilever was 300 cm(2)/g and the mass of 5 ng was detectable.
引用
收藏
页码:43 / 52
页数:10
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