机构:Inst of Space and Astronautical, Science, Kanagawa, Japan
Hirosawa, H
机构:
[1] Inst of Space and Astronautical, Science, Kanagawa, Japan
来源:
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
|
1997年
/
35卷
/
03期
关键词:
D O I:
10.1109/36.582005
中图分类号:
P3 [地球物理学];
P59 [地球化学];
学科分类号:
0708 ;
070902 ;
摘要:
A probabilistic explanation is given to randomly-distributed, dark curved-line patterns which we observe in images with speckle, such as in one-look synthetic aperture radar images. Also it is shown that multi-look processing weakens the appearance of such line features.