An XAS study of the defect structure of Ti-doped α-Cr2O3

被引：50
作者：
Blacklocks, Aran N.
Atkinson, Alan
Packer, Robert J.
Savin, Shelley L. P.
Chadwick, Alan V.
机构：
[1] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England
[2] Univ Kent, Sch Phys Sci, Funct Mat Grp, Canterbury CT2 7NH, Kent, England
来源：
SOLID STATE IONICS | 2006年 / 177卷 / 33-34期
关键词：
chromium oxide; XAS; EXAFS; XANES; point defects; gas sensor;
D O I：
10.1016/j.ssi.2006.08.028
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The bulk defect structure in Cr2-xTixO3 (x = 0.05, 0.20 and 0.30) has been studied by X-ray absorption spectroscopy measurements at the Cr and Ti K-edges. The results show that the Ti is predominantly present in the IV oxidation state and resides on the normal Cr host lattice site. The dopant is charge compensated by Cr3+ vacancies and there is evidence for the formation of defect clusters; however, the detailed structure of these clusters could not be deduced. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：2939 / 2944
页数：6
相关论文
共 20 条
[11]   ELECTRICAL-CONDUCTIVITY AND DEFECT STRUCTURE OF CR2O3 .1. HIGH-TEMPERATURES (GREATER-THAN-SIMILAR-TO-1000-DEGREES-C) [J].
HOLT, A ;
KOFSTAD, P .
SOLID STATE IONICS, 1994, 69 (02) :127-136
[12]   OXYGEN ACTIVITY DEPENDENCE OF THE ELECTRICAL-CONDUCTIVITY OF LI-DOPED CR2O3 [J].
HUANG, RF ;
AGARWAL, AK ;
ANDERSON, HU .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1984, 67 (02) :146-150
[13]  
Koningsberger D.C., 1988, XRAY ABSORPTION
[14]   Ex situ reflection mode EXAFS at the TiK-edge of lithium intercalated TiO2 rutile [J].
Lützenkirchen-Hecht, D ;
Wagemaker, M ;
Keil, P ;
van Well, AA ;
Frahm, R .
SURFACE SCIENCE, 2003, 538 (1-2) :10-22
[15]   A SELECTIVE AMMONIA SENSOR [J].
MOSELEY, PT ;
WILLIAMS, DE .
SENSORS AND ACTUATORS B-CHEMICAL, 1990, 1 (1-6) :113-115
[16]   XANES study of Ti coordination in heat-treated (TiO2)x(SiO2)1-x xerogels [J].
Mountjoy, G ;
Pickup, DM ;
Wallidge, GW ;
Anderson, R ;
Cole, JM ;
Newport, RJ ;
Smith, ME .
CHEMISTRY OF MATERIALS, 1999, 11 (05) :1253-1258
[17]   Experimental and computational study of the gas-sensor behaviour and surface chemistry of the solid-solution Cr2-xTixO3 (x≤0.5) [J].
Niemeyer, D ;
Williams, DE ;
Smith, P ;
Pratt, KFE ;
Slater, B ;
Catlow, CRA ;
Stoneham, AM .
JOURNAL OF MATERIALS CHEMISTRY, 2002, 12 (03) :667-675
[18]  
PENNERHAHN JE, 2005, COORDIN CHEM REV, V249, P2005
[19]   RESIDUAL ELECTRON-DENSITY STUDY OF CHROMIUM SESQUIOXIDE BY CRYSTAL-STRUCTURE AND SCATTERING FACTOR REFINEMENT [J].
SAWADA, H .
MATERIALS RESEARCH BULLETIN, 1994, 29 (03) :239-245
[20]  
Teo B. K., 1986, EXAFS BASIC PRINCIPL
12