Review of the wettability of solder with a wetting balance test for recent advanced microelectronic packaging

被引:32
作者
Jung, Do-Hyun [1 ]
Jung, Jae-Pil [1 ]
机构
[1] Univ Seoul, Dept Mat Sci & Engn, Seoul, South Korea
关键词
Surface tension; wetting balance test; wetting force; wetting property; zero cross time; LEAD-FREE SOLDER; SN-AG-CU; WITHDRAWAL FORCE CURVE; COATED SI-WAFER; MECHANICAL-PROPERTIES; SURFACE-TENSION; INTERMETALLIC COMPOUNDS; INTERFACIAL REACTION; IN SOLDER; MICROSTRUCTURE;
D O I
10.1080/10408436.2018.1490249
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper reviewed the wetting properties of solder for microelectronic packaging. The recent demand for high-density packaging has highlighted the need for a sophisticated and improved solder for the miniaturization of electronics. The wetting properties of molten solder on a substrate, which provides successful soldering and reliable solder joints, is one of the most critical properties for the reliability of components in electronic devices because poor wetting can degrade the reliability of the solder. Therefore, the solder must have good wettability to achieve better solderability. The most common testing method is the wetting balance test known as a Meniscograph. During a wetting test, the analysis can be conducted by calculating the wetting force between the molten solder and substrate as a function of time. In addition, the surface tension and wetting time, which are known as the zero cross time of each sample, are obtained from the respective wetting curves. This paper discusses the wetting balance test, including its principle, parameters, experimental procedure, and analysis of the result from the wetting curve. In addition, this paper introduces the recent advances in the wetting property of solder, such as a nano-reinforced composite solder through the addition of 0.05% of nano-sized La2O3 to the solder matrix, which has resulting in an improved wetting time.
引用
收藏
页码:324 / 343
页数:20
相关论文
共 122 条
[1]   Lead-free solders in microelectronics [J].
Abtew, M ;
Selvaduray, G .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) :95-141
[2]  
Adamson A.W., 1967, Physical Chemistry of Surfaces
[3]   Characterizations of Physical Properties of Sn-Bi Solder Alloy [J].
Amares, S. ;
Efzan, M. N. Ervina ;
Yap, T. C. .
MATERIALS, INDUSTRIAL, AND MANUFACTURING ENGINEERING RESEARCH ADVANCES 1.1, 2014, 845 :261-265
[4]   Surface tension and wetting behaviour of molten Cu-Sn alloys [J].
Amore, Stefano ;
Ricci, Enrica ;
Lanata, Tiziana ;
Novakovic, Rada .
JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 452 (01) :161-166
[5]   Sn-Ag-Cu solders and solder joints: Alloy development, microstructure, and properties [J].
Anderson, IE ;
Cook, BA ;
Harringa, JL ;
Terpstra, RL .
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2002, 54 (06) :26-29
[6]  
[Anonymous], 1990, GOLD BULL, DOI DOI 10.1007/BF03214712
[7]   Effect of flux on the wetting characteristics of SnAg, SnCu, SnAgBi, and SnAgCu lead-free solders on copper substrates [J].
Arenas, Mario F. ;
He, Min ;
Acoff, Viola L. .
JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (07) :1530-1536
[8]   Contact angle measurements of Sn-Ag and Sn-Cu lead-free solders on copper substrates [J].
Arenas, MF ;
Acoff, VL .
JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) :1452-1458
[9]  
BECKER G, 1981, WELD J, V60, pS202
[10]   Effect of Pd thickness on wettability and interfacial reaction of Sn-1.0Ag-Ce solders on ENEPIG surface finish [J].
Bui, Q. V. ;
Jung, S. B. .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2014, 25 (01) :423-430