Transmission of low-energy electrons through SiO2 tube

被引：14

作者：

Wang, Wei ^{[1
]}

Qi, Dejun ^{[1
]}

Yu, Deyang ^{[1
]}

Zhang, Mingwu ^{[1
]}

Ruan, Fangfang ^{[1
]}

Chen, Jing ^{[1
]}

Cai, Xiaohong ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

来源：

14TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS (HCI 2008) | 2009年 / 163卷

关键词：

IONS;

D O I：

10.1088/1742-6596/163/1/012093

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The transmission of low-energy (1100eV-1500eV) electrons through SiO2 tube was investigated, the distribution of transmitted beam current was observed. Results indicate that the intensity of transmitted electrons is proportional to the relative incident beam intensity and the angular divergence of the transmitted electrons is reduced when incident energy increased.

引用

页数：4

共 14 条

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