RaDMaX: a graphical program for the determination of strain and damage profiles in irradiated crystals

被引：31

作者：

Souilah, M. ^{[1
]}

Boulle, A. ^{[1
]}

Debelle, A. ^{[2
]}

机构：

[1] CNRS UMR 7315, Ctr Europe Ceram, Sci Procedes Ceram & Traitements Surfaces, 12 Rue Atlantis, F-87068 Limoges, France

[2] Univ Paris 11, CNRS, Ctr Sci Nucl & Sci Mat, IN2P3, F-91405 Orsay, France

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2016年 / 49卷

关键词：

computer programs; X-ray diffraction; irradiation; strain gradients; damage gradients; X-RAY-DIFFRACTION; FILMS;

D O I：

10.1107/S1600576715021019

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

RaDMaX (radiation damage in materials analysed with X-ray diffraction) is a user-friendly graphical program that allows the determination of strain and damage depth profiles in ion-irradiated crystals. This task is achieved by fitting experimental X-ray diffraction data, recorded in symmetrical theta-2 theta geometry, with a dynamical diffraction model parametrized with variable strain and damage profiles based on B-spline functions. The strain and damage profiles can be graphically manipulated so as to fit the calculated curve to the experimental data. Automatic fitting procedures (generalized simulated annealing and conventional least squares) are also implemented. RaDMaX is free and open source (CeCILL licence) and can be downloaded from http://aboulle.github.io/RaDMaX.

引用

页码：311 / 316

页数：6

共 24 条

[1]

[Anonymous], 2004, HIGH RESOLUTION XRAY, DOI DOI 10.1007/978-1-4757-4050-9

[2] ATOMIC DISPLACEMENT PROCESSES IN IRRADIATED METALS [J].

AVERBACK, RS .

JOURNAL OF NUCLEAR MATERIALS, 1994, 216 :49-62

[3] X-RAY-DIFFRACTION OF MULTILAYERS AND SUPERLATTICES [J].

BARTELS, WJ ;

HORNSTRA, J ;

LOBEEK, DJW .

ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :539-545

[4] Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering [J].

Boulle, A. ;

Guinebretiere, R. ;

Dauger, A. .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (21) :3907-3920

[5] A new method for the determination of strain profiles in epitaxic thin films using X-ray diffraction [J].

Boulle, A ;

Masson, O ;

Guinebretière, R ;

Dauger, A .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2003, 36 :1424-1431

[6] Strain profiles in thin films: influence of a coherently diffracting substrate and thickness fluctuations [J].

Boulle, A. ;

Conchon, F. ;

Guinebretiere, R. .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2009, 42 :85-92

[7] Strain-profile determination in ion-implanted single crystals using generalized simulated annealing [J].

Boulle, Alexandre ;

Debelle, Aurelien .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2010, 43 :1046-1052

[8] A SUITE OF PROGRAMS FOR CALCULATING X-RAY ABSORPTION, REFLECTION, AND DIFFRACTION PERFORMANCE FOR A VARIETY OF MATERIALS AT ARBITRARY WAVELENGTHS [J].

BRENNAN, S ;

COWAN, PL .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :850-853

[9] Interplay between atomic disorder, lattice swelling, and defect energy in ion-irradiation-induced amorphization of SiC [J].

Debelle, A. ;

Boulle, A. ;

Chartier, A. ;

Gao, F. ;

Weber, W. J. .

PHYSICAL REVIEW B, 2014, 90 (17)

[10] Comprehensive study of the effect of the irradiation temperature on the behavior of cubic zirconia [J].

Debelle, A. ;

Channagiri, J. ;

Thome, L. ;

Decamps, B. ;

Boulle, A. ;

Moll, S. ;

Garrido, F. ;

Behar, M. ;

Jagielski, J. .

JOURNAL OF APPLIED PHYSICS, 2014, 115 (18)

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