A Low Noise Amplifier Co-designed with ESD Protection Circuit in 65-nm CMOS

被引:3
作者
Tsai, Ming-Hsien [1 ]
Hsu, Shawn S. H. [1 ]
Tan, Kevin K. W. [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu, Taiwan
来源
2009 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-3 | 2009年
关键词
ESD; Low noise amplifier; CMOS; power-clamp;
D O I
10.1109/MWSYM.2009.5165761
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
By means of co-design ESD protection circuit as the low noise amplifier (LNA) input matching network, a 5.8-GHz LNA with excellent ESD and noise performances is demonstrated by a 65-nm CMOS technology. The diode-based ESD design with a power clamp can achieve 4 07 human body model (HBM) performance while the noise figure (NF) is only 0.05 dB higher than that of the LNA without the extra ESD blocks. Under a supply voltage of 1.2 V and drain current of 7 mA, the ESD-LNA has a NF of 1.9 dB with an associated power gain of 18 dB. The input third-order intercept point (IIP3) is -11 dBm and the input and output insertion losses are below -16 dB and -20 dB, respectively.
引用
收藏
页码:573 / +
页数:2
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