Direct evaluation of composition profile, strain relaxation, and elastic energy of Ge:Si(001) self-assembled islands by anomalous x-ray scattering -: art. no. 245312

The growth of strained epitaxial self assembled nanocrystals is comprised of a variety of kinetic and thermodynamic factors that determine their morphology and size. Some of the significant factors to their stability are strain and interdiffusion. Here we directly measure the gradient of composition and strain in Ge nanocrystals grown on Si(001) using anomalous x-ray scattering. By combining our x-ray results, where we relate strain, interdiffusion, and shape with atomic force microscopy measurements, we have been able to determine the complete strain configuration of these islands. We show that the amount of elastic energy in pyramids and domes can be evaluated. The transition from pyramids to domes is accompanied by an increase of lattice parameter and enhancement of interdiffusion, both leading to a drastic decrease of the elastic energy stored per atom.