Formation of ZnO Nanoparticles by Atomic Layer Deposition for the Nonvolatile Memory Thin-Film Transistor Applications

被引:0
|
作者
Seo, Gi-Ho [1 ]
Yun, Da-Jeong [1 ]
Lee, Won-Ho [1 ]
Kim, So-Jung [1 ]
Yoon, Sung-Min [1 ]
机构
[1] Kyung Hee Univ, Dept Adv Mat Engn Informat & Elect, Yongin 17104, Geonggi Do, South Korea
来源
THIN FILM TRANSISTORS 13 (TFT 13) | 2016年 / 75卷 / 10期
关键词
D O I
10.1149/07510.0241ecst
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A low-temperature atomic-layer-deposition (ALD) process for the formation of ZnO nanoparticles (NPs) was demonstrated, in which the ALD temperature and cycles for diethylzinc precursor were controlled to be 160 degrees C and 20 cycles. The size and areal density of ZnO NPs were confirmed to be approximately 33 nm and 3x10(9) cm(-2), respectively. Nonvolatile memory thin-film transistors were fabricated by employing the ZnO NPs as charge-trap centers for memory operations. The memory window was found to increase from 0.6 to 17.8 V with increasing the ALD cycles from 5 to 20. On- and off-program operations were also confirmed even with voltage pulses as short as 1 mu s.
引用
收藏
页码:241 / 245
页数:5
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