Bright-field TEM imaging of single molecules: Dream or near future?

被引:14
作者
Malac, Marek
Beleggia, Marco
Egerton, Ray
Zhu, Yimei
机构
[1] Natl Inst Nanotechnol, Edmonton, AB T6G 2M9, Canada
[2] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA
[3] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
spherical aberration; radiation damage; bright-field TEM; high-resolution TEM; single molecule imaging; low-dose imaging; field-emission source;
D O I
10.1016/j.ultramic.2006.05.001
中图分类号
TH742 [显微镜];
学科分类号
摘要
We examine the suitability of spherical aberration (Cs)-corrected (CS) and uncorrected (UC) transmission electron microscopes (TEM) for conventional bright-field imaging of radiation-sensitive materials. We have chosen an individual molecule suspended in vacuum as a hypothetical example of a well-defined radiation-sensitive sample. We find that for this particular sample, CS instruments provide about 30% improvement over an UC instrument in terms of signal/noise ratio per unit electron dose at 300 kV. The lowest imaging doses can be achieved in CS instruments equipped with high-brightness electron source operated at low incident electron energies. Our calculations suggest that it may be possible to image individual, iodine- or bromine-substituted organic molecules in bright-field mode, at doses lower than the accepted values for radiation damage of aromatic molecules. Crown Copyright (c) 2006 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:40 / 49
页数:10
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