Sn-based waveguide p-i-n photodetector with strained GeSn/Ge multiple-quantum-well active layer

被引:76
作者
Huang, Yu-Hui [1 ,2 ]
Chang, Guo-En [1 ,2 ]
Li, Hui [3 ,4 ]
Cheng, H. H. [3 ,4 ]
机构
[1] Natl Chung Cheng Univ, Dept Mech Engn, Minxiong Township 62102, Chiayi County, Taiwan
[2] Natl Chung Cheng Univ, Adv Inst Mfg High Tech Innovat, Minxiong Township 62102, Chiayi County, Taiwan
[3] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 10617, Taiwan
[4] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10617, Taiwan
关键词
GE1-XSNX/GE SUPERLATTICES; MQW LEDS; SILICON; LASERS;
D O I
10.1364/OL.42.001652
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on Sn-based p-i-n waveguide photodetectors (WGPD) with a pseudomorphic GeSn/Ge multiple-quantumwell (MQW) active layer on a Ge-buffered Si substrate. A reduced dark-current density of 59 mA/cm(2) was obtained at a reverse bias of 1 V due to the suppressed strain relaxation in the GeSn/Ge active layer. Responsivity experiments revealed an extended photodetection range covering the O, E, S, C, and L telecommunication bands completely due to the bandgap reduction resulting from Sn-alloying. Band structure analysis of the pseudomorphic GeSn/Ge quantum well structures indicated that, despite the stronger quantum confinement, the absorption edge can be shifted to longer wavelengths by increasing the Sn content, thereby enabling efficient photodetection in the infrared region. These results demonstrate the feasibility of using GeSn/Ge MQW planar photodetectors as building blocks of electronic-photonic integrated circuits for telecommunication and optical interconnection applications. (C) 2017 Optical Society of America
引用
收藏
页码:1652 / 1655
页数:4
相关论文
共 23 条
[1]   Optical Characterization of Si-Based Ge1-x Sn x Alloys with Sn Compositions up to 12% [J].
Al-Kabi, Sattar ;
Ghetmiri, Seyed Amir ;
Margetis, Joe ;
Du, Wei ;
Mosleh, Aboozar ;
Alher, Murtadha ;
Dou, Wei ;
Grant, Joshua M. ;
Sun, Greg ;
Soref, Richard A. ;
Tolle, John ;
Li, Baohua ;
Mortazavi, Mansour ;
Naseem, Hameed A. ;
Yu, Shui-Qing .
JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (04) :2133-2141
[2]   Quantum-confined photoluminescence from Ge1-xSnx/Ge superlattices on Ge-buffered Si(001) substrates [J].
Chang, Guo-En ;
Hsieh, Wen-Yao ;
Chen, Jia-Zhi ;
Cheng, Henry H. .
OPTICS LETTERS, 2013, 38 (18) :3485-3487
[3]   Strain-Balanced GezSn1-z-SixGeySn1-x-y Multiple-Quantum-Well Lasers [J].
Chang, Guo-En ;
Chang, Shu-Wei ;
Chuang, Shun Lien .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2010, 46 (12) :1813-1820
[4]   Theory for n-type doped, tensile-strained Ge-SixGeySn1-x-y quantum-well lasers at telecom wavelength [J].
Chang, Guo-En ;
Chang, Shu-Wei ;
Chuang, Shun Lien .
OPTICS EXPRESS, 2009, 17 (14) :11246-11258
[5]   Structural and optical characteristics of Ge1-xSnx/Ge superlattices grown on Ge-buffered Si(001) wafers [J].
Chen, Jia-Zhi ;
Li, H. ;
Cheng, H. H. ;
Chang, Guo-En .
OPTICAL MATERIALS EXPRESS, 2014, 4 (06) :1178-1185
[6]   Optical critical points of thin-film Ge1-ySny alloys:: A comparative Ge1-ySny/Ge1-xSix study [J].
D'Costa, VR ;
Cook, CS ;
Birdwell, AG ;
Littler, CL ;
Canonico, M ;
Zollner, S ;
Kouvetakis, J ;
Menéndez, J .
PHYSICAL REVIEW B, 2006, 73 (12)
[7]   Ultra compact 45 GHz CMOS compatible Germanium waveguide photodiode with low dark current [J].
DeRose, Christopher T. ;
Trotter, Douglas C. ;
Zortman, William A. ;
Starbuck, Andrew L. ;
Fisher, Moz ;
Watts, Michael R. ;
Davids, Paul S. .
OPTICS EXPRESS, 2011, 19 (25) :24897-24904
[8]   Germanium-tin multiple quantum well on silicon avalanche photodiode for photodetection at two micron wavelength [J].
Dong, Yuan ;
Wang, Wei ;
Lee, Shuh Ying ;
Lei, Dian ;
Gong, Xiao ;
Loke, Wan Khai ;
Yoon, Soon-Fatt ;
Liang, Gengchiau ;
Yeo, Yee-Chia .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2016, 31 (09)
[9]   Epitaxial III-V-on-silicon waveguide butt-coupled photodetectors [J].
Feng, Shaoqi ;
Geng, Yu ;
Lau, Kei May ;
Poon, Andrew W. .
OPTICS LETTERS, 2012, 37 (19) :4035-4037
[10]   GeSn/Ge heterostructure short-wave infrared photodetectors on silicon [J].
Gassenq, A. ;
Gencarelli, F. ;
Van Campenhout, J. ;
Shimura, Y. ;
Loo, R. ;
Narcy, G. ;
Vincent, B. ;
Roelkens, G. .
OPTICS EXPRESS, 2012, 20 (25) :27297-27303