Simulation of J0 imaging techniques with PVMOS

被引:0
作者
Pieters, Bart E. [1 ]
机构
[1] Forschungszentrum Julich, Photovolta IEK5, D-52425 Julich, Germany
来源
2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2016年
关键词
Photovoltaic cells; Numerical simulation; Silicon devices; MODEL;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
A detailed understanding of the behavior of multi-crystalline silicon solar cells needs to consider the impact of inhomogeneities, and therefore requires means for characterizing as well as modeling inhomogeneities. In this work the capabilities of the modeling tool Photo -Voltaic Module Simulator (PVMOS) to model inhomogeneous devices are demonstrated. To this end photo -luminescence (PL) based saturation current density (J(0)) imaging techniques are investigated. A realistic spatial Jo distribution is modeled by importing an experimental J(0)-image of a 15.6x15.6cm(2) solar cell in our simulator. Subsequently, we use PVMOS to simulate two J(0) imaging techniques. This allows for an estimation of the accuracy of the J(0) imaging methods as we can directly compare the J(0) input data with the reconstructed J(0) image.
引用
收藏
页码:2503 / 2506
页数:4
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