Missing Conductivity in the THz Skin-Depth Layer of Metals

被引：0
|
作者：
Laman, N. [1 ]
Grischkowsky, D. [1 ]
机构：
[1] Oklahoma State Univ, Sch Elect & Comp Engn, Stillwater, OK 74078 USA
来源：
2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The conductivity of the THz skin-depth layer of Al films in contact with silicon was measured via a parallel plate waveguide. The increase of conductivity at lower temperatures is extremely sensitive to the surface quality. (c) 2007 Optical Society of America
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页码：1510 / 1511
页数：2
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