A Double-Tail Sense Amplifier for Low-Voltage SRAM in 28nm Technology

被引:0
|
作者
Chiu, Pi-Feng [1 ]
Zimmer, Brian [1 ]
Nikolic, Borivoje [1 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A double-tail sense amplifier (DTSA) is designed as a drop-in replacement for a conventional SRAM sense amplifier (SA), to enable a robust read operation at low voltages. A pre-amplification stage helps reduce the offset voltage of the sense amplifier by magnifying the input of the regeneration stage. The self-timed regenerative latch simplifies the timing logic so the DTSA can replace the SA with no area overhead. A test chip in 28nm technology achieves 56% error rate reduction at 0.44V. The proposed scheme achieves 50mV of VDDmin reduction compared to commercial SRAM with a faster timing option that demonstrates a smaller bitline swing.
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页码:181 / 184
页数:4
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