A Double-Tail Sense Amplifier for Low-Voltage SRAM in 28nm Technology

被引:0
|
作者
Chiu, Pi-Feng [1 ]
Zimmer, Brian [1 ]
Nikolic, Borivoje [1 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A double-tail sense amplifier (DTSA) is designed as a drop-in replacement for a conventional SRAM sense amplifier (SA), to enable a robust read operation at low voltages. A pre-amplification stage helps reduce the offset voltage of the sense amplifier by magnifying the input of the regeneration stage. The self-timed regenerative latch simplifies the timing logic so the DTSA can replace the SA with no area overhead. A test chip in 28nm technology achieves 56% error rate reduction at 0.44V. The proposed scheme achieves 50mV of VDDmin reduction compared to commercial SRAM with a faster timing option that demonstrates a smaller bitline swing.
引用
收藏
页码:181 / 184
页数:4
相关论文
共 50 条
  • [1] Comparative Study of Current Mode and Voltage Mode Sense Amplifier used for 28nm SRAM
    Mohammad, Baker
    Dadabhoy, Percy
    Lin, Ken
    Bassett, Paul
    2012 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (ICM), 2012,
  • [2] Analysis and Design of a Low-Voltage Low-Power Double-Tail Comparator
    Babayan-Mashhadi, Samaneh
    Lotfi, Reza
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2014, 22 (02) : 343 - 352
  • [3] Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction in 28nm CMOS
    Abu-Rahma, Mohamed H.
    Chen, Ying
    Sy, Wing
    Ong, Wee Ling
    Ting, Leon Yeow
    Yoon, Sei Seung
    Han, Michael
    Terzioglu, Esin
    2011 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2011,
  • [4] Low-Voltage Bandgap Reference Circuit in 28nm CMOS
    Yan, Zhanke
    Zhang, Chunming
    Wang, Menghai
    2018 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2018), 2018, : 14 - 17
  • [5] High-performance and low-voltage sense-amplifier techniques for sub-90nm SRAM
    Sinha, M
    Hsu, S
    Alvandpour, A
    Burleson, W
    Krishnamurthy, R
    Borkar, S
    IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2003, : 113 - 116
  • [6] Analysis, Modeling and Silicon Correlation of Low-voltage Flop Data Retention in 28nm Process Technology
    Datta, Animesh
    Abu-Rahma, Mohamed
    Dasnurkar, Sachin
    Rasouli, Hadi
    Tamjidi, Sean
    Cai, Ming
    Sengupta, Samit
    Chidambaram, P. R.
    Thirumala, Raghavan
    Kulkarni, Nikhil
    Seeram, Prasanna
    Bhadri, Prasad
    Patel, Prayag
    Yoon, Sei Seung
    Terzioglu, Esin
    PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2013), 2013, : 580 - 584
  • [7] A Low-Power Charge Sharing Hierarchical Bitline and Voltage-Latched Sense Amplifier for SRAM Macro in 28 nm CMOS Technology
    Hong, Chi-Hao
    Chiu, Yi-Wei
    Zhao, Jun-Kai
    Jou, Shyh-Jye
    Wang, Wen-Tai
    Lee, Reed
    2014 27TH IEEE INTERNATIONAL SYSTEM-ON-CHIP CONFERENCE (SOCC), 2014, : 160 - 164
  • [8] 28nm STT-MRAM Array and Sense Amplifier
    Kwak, Jin Woong
    Marshall, Andrew
    Stiegler, Harvey
    2019 8TH INTERNATIONAL CONFERENCE ON MODERN CIRCUITS AND SYSTEMS TECHNOLOGIES (MOCAST), 2019,
  • [9] Modified Decoupled Sense Amplifier with Improved Sensing Speed for Low-Voltage Differential SRAM
    Dahiya, Ayush
    Mittal, Poornima
    Rohilla, Rajesh
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2023, 28 (06)
  • [10] An Innovative Ultra Low Voltage sub-32nm SRAM Voltage Sense Amplifier in DG-SOI Technology
    Pranav, Pranav
    Giraud, Bastien
    Amara, Amara
    2008 51ST MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2, 2008, : 205 - +