Evaluation of a Mixed-Signal Design Diversity System under Radiation Effects

被引：0

作者：

Gonzalez, Carlos J. ^{[1
]}

Chenet, Cristiano P. ^{[1
]}

Budelon, Matheus ^{[1
]}

Vaz, Rafael Galhardo ^{[2
]}

Goncalez, Odair ^{[2
]}

Balen, Tiago R. ^{[1
]}

机构：

[1] Fed Univ Rio Grande Sul UFRGS, Grad Program Microelect PGMICRO, Porto Alegre, RS, Brazil

[2] Inst Adv Studies IEAv, Sao Jose Dos Campos, SP, Brazil

来源：

2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017) | 2017年

关键词：

Radiation Effects; Design Diversity; Mixed-Signal; Programmable System-on-Chip (PSoC); COSMIC-RAYS; MOS DEVICES; OXIDES; DAMAGE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work a data acquisition system, based on a design diversity redundant scheme, is tested under total ionizing dose effects. The data acquisition system is composed by three ADCs and two voters, implementing different levels of diversity (architectural and temporal). This system is implemented on a 130nm commercial mixed-signal programmable SoC (PSoC 5), from Cypress Semiconductor. The system was tested under Co-60 gamma radiation with a dose rate of 1 krad(Si)/h reaching a total dose of 242 krad(Si). One of the system copies presented a significant degradation on its linearity during the irradiation, while the others kept the functionality with less severe degradation, evidencing the advantage of using diversity to improve resilience in mixed-signal redundant systems.

引用

页数：6

共 42 条

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