Microstructures Property and Improved Jc of Eu-Doped YBa2Cu3.6O7-δ Thin Films by Trifluoroacetate Metal Organic Deposition Process

被引:6
作者
Li, M. Y. [1 ]
Fang, Q. [1 ]
Hu, X. F. [1 ]
Liu, Z. Y. [1 ,2 ]
Guo, Y. Q. [1 ,2 ]
Lu, Y. M. [1 ,2 ]
Bai, C. Y. [1 ,2 ]
Cai, C. B. [1 ,2 ]
机构
[1] Shanghai Univ, Phys Dept, Shanghai Key Lab High Temp Superconductors, 99 Shangda Rd, Shanghai 200444, Peoples R China
[2] Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China
基金
中国国家自然科学基金;
关键词
Critical current density; Europium addition; Flux pinning; TFA-MOD; Microstructures; Superconducting transition temperature; NANOPARTICLES;
D O I
10.1007/s10948-016-3891-6
中图分类号
O59 [应用物理学];
学科分类号
摘要
YEuxBa2Cu3.6O7-delta(x = 0, 0.1, 0.3, 0.5) thin films were prepared on buffered substrates by trifluoroacetate metal organic deposition (TFA-MOD). The europium-doped film showed better out-and in-plane texture than the pure YEuxBa2Cu3.6O7-delta thin film and special topography. In the meantime, the superconducting transition temperature T-c was improved with the increase of europium content and spanned a small range when x = 0.5 doping levels. Besides, the J(c) value was obviously enhanced with europium addition, and YEuxBa2Cu3.6O7-delta showed the best superconducting properties under self-field. Furthermore, the Jc value was obviously improved under magnetic field, and the enhanced flux-pinning properties was also observed in europium-substituted samples which may be attributed to the good grain connections and the effective flux pinning centers introduced by europium addition. The thickness of prepared film samples were approximately 400 nm. The structure of samples were characterized by x-ray diffraction (XRD), Raman spectrum was used to investigate the crystallization and growth orientation, and the surface morphology of films were got by field-emission scanning electronic microscopy (FE-SEM). Moreover, energy-dispersive spectroscopy (EDS) was utilized to determine element composition. Spatial distribution of Jc of the film was obtained by mapping analysis of inductive measurement at 77 K. And the superconducting properties under magnetic fields were measured by magnetic property measurement system with a SQUID magnetometer.
引用
收藏
页码:1137 / 1143
页数:7
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