SOI Refractive Index Sensor Based on Tilted Bragg Gratings Mode Conversion

被引：4

作者：

Elzahaby, Eman A. ^{[1
,2
]}

Elbab, Ahmed M. R. Fath ^{[1
]}

Shalaby, Hossam ^{[1
,2
]}

机构：

[1] Egypt Japan Univ Sci & Technol E JUST, Alexandria 21934, Egypt

[2] Alexandria Univ, Fac Engn, Alexandria 21544, Egypt

来源：

2020 22ND INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS (ICTON 2020) | 2020年

关键词：

Bragg gratings; integrated optics; optical sensors; silicon photonics; silicon-on-insulator;

D O I：

10.1109/icton51198.2020.9203110

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An integrated optical mode converter, based on tilted Bragg surface gratings in silicon-on-insulator technology, is designed to achieve features needed to promote a refractive index integrated sensor. The tilted grating is optimized to minimize device footprint (60 lam), and to obtain a narrow resonance full width at half maximum FWHM (7.3 nm) and a significant transmission dip (-10 dB). The proposed device achieves a linear response over a relative wide wavelength range, and a high sensitivity of 160 nm/RIU.

引用

页数：4

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