Transverse-mode control in vertical-cavity surface-emitting lasers via a patterned phase aperture

被引：2
作者：
Achtenhagen, M. [1 ]
Hardy, A. [1 ]
Kapon, E. [1 ]
机构：
[1] Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland
来源：
APPLIED OPTICS | 2006年 / 45卷 / 35期
关键词：
D O I：
10.1364/AO.45.008999
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Transverse-mode discrimination in vertical-cavity surface-emitting lasers that contain a patterned phase aperture is analyzed numerically. The two lowest-order modes are calculated for different aperture shapes and sizes. They are then expanded in Laguerre-Gaussian modes to study the power distribution as well as their beam propagation factor. The mode selection depends on the aperture's size and degree of symmetry. The maximum value for the mode discrimination in the case of a specific phase aperture is determined, and an enhancement by a factor of 3, compared to the case without a phase aperture, is found. (c) 2006 Optical Society of America.
引用
收藏
页码：8999 / 9006
页数：8
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