Transverse-mode control in vertical-cavity surface-emitting lasers via a patterned phase aperture

被引：2
作者：
Achtenhagen, M. [1 ]
Hardy, A. [1 ]
Kapon, E. [1 ]
机构：
[1] Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland
来源：
APPLIED OPTICS | 2006年 / 45卷 / 35期
关键词：
D O I：
10.1364/AO.45.008999
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Transverse-mode discrimination in vertical-cavity surface-emitting lasers that contain a patterned phase aperture is analyzed numerically. The two lowest-order modes are calculated for different aperture shapes and sizes. They are then expanded in Laguerre-Gaussian modes to study the power distribution as well as their beam propagation factor. The mode selection depends on the aperture's size and degree of symmetry. The maximum value for the mode discrimination in the case of a specific phase aperture is determined, and an enhancement by a factor of 3, compared to the case without a phase aperture, is found. (c) 2006 Optical Society of America.
引用
收藏
页码：8999 / 9006
页数：8
相关论文
共 19 条
  • [1] Three-dimensional analysis of mode discrimination in vertical-cavity surface-emitting lasers
    Achtenhagen, M
    Hardy, A
    Kapon, E
    [J]. APPLIED OPTICS, 2005, 44 (14) : 2832 - 2838
  • [2] Design of distributed bragg reflector structures for transverse-mode discrimination in vertical-cavity surface-emitting lasers
    Achtenhagen, M
    Hardy, AA
    Kapon, E
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2004, 22 (08) : 1962 - 1967
  • [3] 2ND-MOMENT APPROACH TO THE TIME-AVERAGED SPATIAL CHARACTERIZATION OF MULTIPLE-TRANSVERSE-MODE LASER-BEAMS
    CHAMPAGNE, Y
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (08): : 1707 - 1714
  • [4] CONTROL OF VERTICAL-CAVITY LASER POLARIZATION WITH ANISOTROPIC TRANSVERSE CAVITY GEOMETRIES
    CHOQUETTE, KD
    LEIBENGUTH, RE
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1994, 6 (01) : 40 - 42
  • [5] Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beam etching
    Dowd, P
    Raddatz, L
    Sumaila, Y
    Asghari, M
    White, IH
    Heard, PJ
    Allen, GC
    Schneider, RP
    Tan, MRT
    Wang, SY
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1997, 9 (09) : 1193 - 1195
  • [6] RESONANT MODES IN A MASER INTERFEROMETER
    FOX, AG
    LI, T
    [J]. BELL SYSTEM TECHNICAL JOURNAL, 1961, 40 (02): : 453 - +
  • [7] Electro-optic birefringence in semiconductor vertical-cavity lasers
    Hendriks, RFM
    vanExter, MP
    Woerdman, JP
    vanGeelen, A
    Weegels, L
    Gulden, KH
    Moser, M
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (18) : 2599 - 2601
  • [8] IGA K, 1992, IEICE T FUND ELECTR, VE75A, P12
  • [9] JOHNSTON TF, 1990, LASER FOCUS WORLD, V26, P173
  • [10] Transverse mode selection in large-area oxide-confined vertical-cavity surface-emitting lasers using a shallow surface relief
    Martinsson, H
    Vukusic, JA
    Grabherr, M
    Michalzik, R
    Jäger, R
    Ebeling, KJ
    Larsson, A
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1999, 11 (12) : 1536 - 1538
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