Impact of 40 Years of Technology Advances on EDS System Performance

被引:7
作者
McCarthy, Jon [1 ]
Friel, John [2 ]
Camus, Patrick [3 ]
机构
[1] Univ Wisconsin, Coll Engn, Ctr Mat Sci, Madison, WI 53706 USA
[2] Temple Univ, Dept Geol, Philadelphia, PA 19122 USA
[3] Thermo Fisher Sci, Mkt & Applicat Grp, Madison, WI 53711 USA
关键词
microbeam analysis; X-ray microanalysis; energy dispersive spectroscopy; Si(Li) detector; FET; incomplete charge collection; silicon drift detectors; PULSE PROCESSOR; SPECTROMETRY;
D O I
10.1017/S1431927609990390
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The rapid advance and falling costs of computing power and data storage during the last 40 years have greatly enhanced the data reduction speed and analytical capacity of energy dispersive spectroscopy (EDS) systems. At the same time, the solid state X-ray detector [until recently, the Si(Li) diode] has seen performance increases due to the use of advanced materials and processing techniques. In addition, the performance of the electronic components (field effect transistor, preamp, and pulse processor) of an EDS system has been constantly improved. These technology advances have resulted in improved spectral quality, excellent light element detection, and increased count rate performance. The results have been truly remarkable and driven by the needs of the analyst. This article will summarize the progress made in these areas in the last 40 years and make a brief reference to prospects for future development in EDS system performance.
引用
收藏
页码:484 / 490
页数:7
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