Single event-induced instability in linear voltage regulators

被引：18
作者：
Adell, P. C.
Witulski, A. F.
Schrimpf, R. D.
Marec, R.
Pouget, V.
Calvel, P.
Bezerra, F.
机构：
[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA
[2] Alcatel Alenia Sp, F-31037 Toulouse, France
[3] Univ Bordeaux 1, CNRS, IXL Lab, F-33405 Talence, France
[4] CNES, French Space Agcy, F-31055 Toulouse, France
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2006年 / 53卷 / 06期
关键词：
linear voltage regulator; macro-model; Single Event Oscillation;
D O I：
10.1109/TNS.2006.886214
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
SET-induced oscillations were measured on a stable linear-regulator that uses the LM124 op-amp in its regulation block. Simulations showed that single events act as stimuli that initiate a large-signal oscillation in the LM124 differential amplifier and compensation capacitor path. Laser testing validated the analysis and confirmed that transistors connected to the compensation capacitor are the most vulnerable.
引用
收藏
页码：3506 / 3511
页数：6
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