Speckle analysis of resonant secondary emission

被引：0
|
作者：
Langbein, W [1 ]
机构：
[1] Univ Dortmund, D-44227 Dortmund, Germany
来源：
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2002年 / 234卷 / 01期
关键词：
D O I：
10.1002/1521-3951(200211)234:1<84::AID-PSSB84>3.0.CO;2-Y
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The technique of the speckle analysis of resonant secondary emission is reviewed. It is a novel, linear optical technique to measure the microscopic intensity and polarization dynamics in inhomogeneously broadened ensembles, that represents an alternative for established non-linear optical techniques such as photon-echo or spectral hole burning. Both time-resolved and spectrally resolved variants of the speckle analysis are discussed. Experimental results obtained on semiconductor quantum wells using both techniques are presented.
引用
收藏
页码：84 / 95
页数：12
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