Determination of the Residual Amplified Spontaneous Emission in Single-Mode Semiconductor Optical Amplifiers

被引：0

作者：

Arar, Bassem ^{[1
]}

Kuerbis, Christian ^{[1
]}

Wenzel, Hans ^{[1
]}

Wicht, Andreas ^{[1
]}

机构：

[1] Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany

来源：

2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2019年

关键词：

D O I：

10.1109/cleoe-eqec.2019.8872647

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页数：1

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