Group-delay ripple reduction in step-chirped fiber Bragg gratings by using laser-beam written step-chirped phase masks

被引：8

作者：

Komukai, T ^{[1
]}

Inui, T

Kurihara, M

Fujimoto, S

机构：

[1] NTT Corp, NTT Network Innovat Labs, Kanagawa 2390847, Japan

[2] Dai Nippon Printing Co Ltd, Semicond Components Lab, Saitama 3568507, Japan

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2002年 / 14卷 / 11期

关键词：

chirped fiber Bragg grating (FBG); electron-beam; group-delay ripple; laser-beam; phase error; phase mask; stitching error;

D O I：

10.1109/LPT.2002.803367

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Step-chirped phase masks for step-chirped fiber Bragg gratings (FBGs) were fabricated by employing a new writing strategy, in which the beam is able to scan a step-chirped pattern all at once or continuously. This new writing strategy was realized by using a raster scan-type laser-beam writing system. Linearly and nonlinearly step-chirped FBGs, fabricated by using these masks, show very low group-delay ripple characteristics, which means that the masks have fewer stitching errors than conventional step-chirped masks.

引用

页码：1554 / 1556

页数：3

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