Grain-size effect on the optical properties of vacuum deposited nanocrystalline AS2S3 thin films

被引:0
作者
Babeva, T. Z. [1 ]
Dikova, J. [1 ]
Rashkova, V. [1 ]
机构
[1] Bulgarian Acad Sci, Cent Lab Photoproc, BU-1113 Sofia, Bulgaria
来源
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2007年 / 9卷 / 01期
关键词
chalcogenide glasses; thin films; nanocrystalline structure; optical properties;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microstructure and optical properties of nanocrystalline and amorphous AS(2)S(3) films with thicknesses in the range 15-70 nm are followed. It is found that within the spectral interval 200-600 nm, the thickness dependencies of the refractive indices n and extinction coefficients k have different trends for both kinds of sample. It is established that the optical band gap energy, E-g, for indirect transitions is almost independent of the thickness of the amorphous films, while a strong reduction of this parameter is observed for the thickest nanocrystalline samples. Also, a fairly strong grain-size effect on the values of Eg for direct optical transitions in crystalline films is found. On the basis of the results obtained, the impact of a nanocrystalline structure on the optical behaviour of vacuum deposited AS(2)S(3) films is discussed.
引用
收藏
页码:170 / 173
页数:4
相关论文
共 15 条
[1]  
ABELES F, 1953, REV OPT, V32, P257
[2]  
Dikova J, 2005, J OPTOELECTRON ADV M, V7, P1281
[3]   Influence of the vacuum deposition conditions on the microstructure of thin As-S films [J].
Dikova, J ;
Starbova, K ;
Michailov, E .
VACUUM, 1998, 51 (02) :199-203
[4]   Influence of the microstructure on the photoinduced transformations in vacuum deposited As2S3 thin films [J].
Dikova, J ;
Starbova, K .
VACUUM, 2000, 58 (2-3) :490-495
[5]   OPTICAL-PROPERTIES OF SB2SE3 THIN-FILMS [J].
ELSHAIR, HT ;
IBRAHIM, AM ;
ELWAHABB, EA ;
AFIFY, MA ;
ELSALAM, FA .
VACUUM, 1991, 42 (14) :911-914
[6]  
Frumar M, 2001, J OPTOELECTRON ADV M, V3, P177
[7]  
KITEL C, 1971, SOLID STATE PHYS
[8]  
KOLOMIETS B, 1967, PHYS TECH SEMICOND, V1, P426
[9]   Analysis of errors in thin-film optical parameters derived from spectrophotometric measurements at normal light incidence [J].
Konstantinov, I ;
Babeva, T ;
Kitova, S .
APPLIED OPTICS, 1998, 37 (19) :4260-4267
[10]  
Mott NF., 2012, Electronic Processes in Non-Crystalline Materials, DOI DOI 10.1063/1.3071145