The effect of heating rate on the phase transformation of Ni/Ti multilayer thin films

被引:7
作者
Cavaleiro, A. J. [1 ]
Ramos, A. S. [1 ]
Martins, R. M. S. [2 ]
Braz Fernandes, F. M. [3 ]
Vieira, M. T. [1 ]
机构
[1] Univ Coimbra, Dept Mech Engn, CEMUC, P-3030788 Coimbra, Portugal
[2] Univ Lisbon, Inst Super Tecn, Inst Plasmas & Fusao Nucl, P-1049001 Lisbon, Portugal
[3] Univ Nova Lisboa, Fac Ciencias & Tecnol, Dept Mat Sci, CENIMAT,I3N, P-2829516 Caparica, Portugal
关键词
NiTi; Multilayer thin films; Phase transformation; Synchrotron radiation; Heating rate; X-RAY-DIFFRACTION; SYNCHROTRON-RADIATION; IN-SITU; INTERFACES; DIFFUSION; EVOLUTION;
D O I
10.1016/j.vacuum.2017.02.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ni/Ti multilayer thin films prepared by dual cathode magnetron sputtering were annealed in vacuum at different heating rates. The structural evolution of the multilayer thin films with nanometric modulation periods was studied in-situ by x-ray diffraction using synchrotron radiation. Independently of the multilayer period, a single step rapid reaction occurs at temperatures above 300 degrees C with the formation of the B2-NiTi austenite phase. The transformation temperature is inversely proportional to the multilayers period (higher temperature for shorter period - 12 nm) and to the heating rate (lower temperature for faster heating rates). (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:23 / 25
页数:3
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