Frequency dependencies of power noise

被引：30

作者：

Garben, B ^{[1
]}

Frech, R

Supper, J

McAllister, MF

机构：

[1] IBM Deutschland, D-71032 Boblingen, Germany

[2] IBM Corp, Poughkeepsie, NY 12601 USA

来源：

IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2002年 / 25卷 / 02期

关键词：

decoupling capacitor; delta-I noise; power distribution; power supply noise; resonances;

D O I：

10.1109/TADVP.2002.804783

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, frequency dependencies of delta-I noise caused by variations of the on-chip switching activity have been analyzed by simulations for a complex computer system board with multi-chip module, especially the impact of coincidences with resonances of the power distribution system. The switching frequency and the noise source waveform have been varied in case of a single delta-I step. For repeated delta-I steps the power noise dependencies on the repetition frequency, the duty cycle and the damping of the resonant loop have been analyzed. Simulations using switching current sources for on-chip switching have been confirmed by simulations with switching resistors plus do voltage source. Mid-frequency noise simulations using SPEED2000 and noise voltage measurements yield the same results within 6% for the first and second voltage droops and overshoots, if the real resistance of power/ground vias and module pins are included in the simulation.

引用

页码：166 / 173

页数：8

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