Microstructure and exchange coupling of segregated oxide perpendicular recording media

被引:24
作者
Nolan, Thomas P. [1 ]
Risner, Juliet D.
Harkness, Samuel D.
Girt, Erol
Wu, Stella Z.
Ju, Ganping
Sinclair, Robert
机构
[1] Seagate Technol, Fremont, CA 94538 USA
[2] Hitachi Global Storage Technol Inc, San Jose, CA 95193 USA
[3] Seagate Technol, Pittsburgh, PA 15222 USA
[4] Stanford Univ, Dept Mat Sci, Stanford, CA 94305 USA
关键词
electron microscopy; magnetic films; perpendicular magnetic recording;
D O I
10.1109/TMAG.2006.888208
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The magnetic properties and corresponding microstructure of (Co80Pt20)(x) (metal oxide)(1-x) perpendicular recording media have been studied as a function of the volume percentage (vol%) of metal oxide sputtering into the magnetic film. The exchange coupling field (H-ex) estimated from the coercivity (H-c) and nucleation field (H-n) decreases rapidly between 0-20 vol% of metal oxide. The analytical transmission electron microscope composition analysis of (Co80Pt20)(x) (TiO2)(1-x) media confirms that the microstructure includes crystalline grain cores in an apparently amorphous oxide matrix. The grain cores comprise only Co and Pt in a nearly constant ratio independent of the vol% of oxide addition. The amorphous matrix contains Co, Ti, and O, but no Pt. The Co concentration is nearly constant in grain boundary and core regions, unlike high-temperature longitudinal recording media wherein Co segregates to form a concentration gradient in the grain core. Perpendicular media thus maintain fairly high anisotropy of the grain core phase, even for very high-oxide concentrations that significantly decrease remanant magnetization (M(r)t), H-c, and thermal stability (KuV/kT).
引用
收藏
页码:639 / 644
页数:6
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