Correlating structure and photophysics in Erbium-doped silicon nanocrystals

被引:0
作者
Coffer, JL [1 ]
Senter, RA [1 ]
Ji, JM [1 ]
机构
[1] Texas Christian Univ, Dept Chem, Ft Worth, TX 76129 USA
来源
PHYSICAL CHEMISTRY OF INTERFACES AND NANOMATERIALS | 2002年 / 4807卷
关键词
silicon; erbium; quantum dots; optoelectronics;
D O I
10.1117/12.451243
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Silicon's position as the semiconductor of choice in micro/nanoelectronics hinges on its ability to shift to new design paradigms such as opto-electronics. Strategies to produce silicon-based light emitters remain limited, however, relying either on quantum confinement effects or optically-active dopants. We are actively studying the effects of incorporating optically-active Erbium centers into discrete crystalline Si nanocrystals. Such nanocrystals have been prepared via the pyrolysis of disilane in the presence of a suitable Er source. Two rather different types of doped materials have been synthesized to date: one involving a random distribution of erbium centers throughout the nanocrystal; the other forces erbium into a location preferentially-enriched near the surface. This work entails the structural characterization of such materials and their photophysical properties, including spectroscopic measurements under the conditions of high pressure.
引用
收藏
页码:131 / 139
页数:9
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