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- [43] Analysis for adsorption behavior of PSL particle by using atomic force microscopy CLEANING TECHNOLOGY IN SEMICONDUCTOR DEVICE MANUFACTURING V, 1998, 35 : 536 - 543
- [44] Application of atomic force microscopy to particle sizing FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1999, 363 (04): : 323 - 332
- [45] Application of atomic force microscopy to particle sizing Fresenius' Journal of Analytical Chemistry, 1999, 363 : 323 - 332