Generalized Parameter Extraction Method for Analog Circuit Fault Diagnosis

被引：0
作者：
Filaretov, V [1 ]
Kurganov, S. [1 ]
Gorshkov, K. [2 ]
机构：
[1] Ulyanovsk State Tech Univ, Dept Elect Engn, Ulyanovsk, Russia
[2] ITMO Univ, Dept EEPEMS, St Petersburg, Russia
来源：
2016 2ND INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING, APPLICATIONS AND MANUFACTURING (ICIEAM) | 2016年
基金：
俄罗斯基础研究基金会;
关键词：
fault diagnosis; electronic circuits; nullor; symbolic techniques; testability analysis; SELECTION;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The symbolic technique for analog fault diagnosis is presented in this paper. The cancellation-free Generalized Parameter Extraction Method for parametric fault diagnosis of electronic circuits is considered. The topological conditions of diagnosability of the active analog circuit are discussed. The algorithm for automotive fault diagnosis is proposed and implemented with the Cirsym symbolic analyzer. The experimental results on a filter circuit show the efficiency and reliability of proposed technique.
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页数：6
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