Enhanced lateral resolution in continuous wave stimulated emission depletion microscopy using tightly focused annular radially polarized excitation beam

被引：6

作者：

Lim, Geon ^{[1
]}

Kim, Wan-Chin ^{[2
]}

Oh, Seunghee ^{[1
,3
]}

Lee, Hyungsuk ^{[1
]}

Park, No-Cheol ^{[1
]}

机构：

[1] Yonsei Univ, Sch Mech Engn, 50 Yonsei Ro, Seoul 03722, South Korea

[2] Hanbat Natl Univ, Dept Smart Mfg Appl Engn, Daejeon, South Korea

[3] Samsung Elect, Global Technol Ctr, Suwon, South Korea

来源：

JOURNAL OF BIOPHOTONICS | 2019年 / 12卷 / 09期

基金：

新加坡国家研究基金会;

关键词：

fluorescence microscopy; PSF engineering; STED microscopy; superresolution; ELECTROMAGNETIC DIFFRACTION; OPTICAL SYSTEMS; STED MICROSCOPY; GENERATION; NANOSCOPY; FIELD; SPOT;

D O I：

10.1002/jbio.201900060

中图分类号：

Q5 [生物化学];

学科分类号：

071010 ; 081704 ;

摘要：

The lateral resolution of continuous wave (CW) stimulated emission depletion (STED) microscopy is enhanced about 12% by applying annular-shaped amplitude modulation to the radially polarized excitation beam. A focused annularly filtered radially polarized excitation beam provides a more condensed point spread function (PSF), which contributes to enhance effective STED resolution of CW STED microscopy. Theoretical analysis shows that the FWHM of the effective PSF on the detection plane is smaller than for conventional CW STED. Simulation shows the donut-shaped PSF of the depletion beam and confocal optics suppress undesired PSF sidelobes. Imaging experiments agree with the simulated resolution improvement.

引用

页数：11

共 35 条

[1] Stimulated Emission Depletion Microscopy [J].

Blom, Hans ;

Widengren, Jerker .

CHEMICAL REVIEWS, 2017, 117 (11) :7377-7427

[2] On polarization effects in fluorescence depletion microscopy [J].

Bokor, Nandor ;

Iketaki, Yoshinori ;

Watanabe, Takeshi ;

Daigoku, Kota ;

Davidson, Nir ;

Fujii, Masaaki .

OPTICS COMMUNICATIONS, 2007, 272 (01) :263-268

[3] Coordinate-targeted fluorescence nanoscopy with multiple off states [J].

Danzl, Johann G. ;

Sidenstein, Sven C. ;

Gregor, Carola ;

Urban, Nicolai T. ;

Ilgen, Peter ;

Jakobs, Stefan ;

Hell, Stefan W. .

NATURE PHOTONICS, 2016, 10 (02) :122-+

[4] Sharper focus for a radially polarized light beam [J].

Dorn, R ;

Quabis, S ;

Leuchs, G .

PHYSICAL REVIEW LETTERS, 2003, 91 (23)

[5] Super-resolution imaging for monitoring cytoskeleton dynamics [J].

Finkenstaedt-Quinn, Solaire A. ;

Qiu, Tian A. ;

Shin, Kayeong ;

Haynes, Christy L. .

ANALYST, 2016, 141 (20) :5674-5688

[6] Follow-up review: recent progress in the development of super-resolution optical microscopy [J].

Fujita, Katsumasa .

MICROSCOPY, 2016, 65 (04) :275-281

[7] Confocal laser scanning microscopy with spatiotemporal structured illumination [J].

Gao, Peng ;

Nienhaus, G. Ulrich .

OPTICS LETTERS, 2016, 41 (06) :1193-1196

[8]

Harke B., 2008, THESIS GEORG AUGUST

[9] Resolution scaling in STED microscopy [J].

Harke, Benjamin ;

Keller, Jan ;

Ullal, Chaitanya K. ;

Westphal, Volker ;

Schoenle, Andreas ;

Hell, Stefan W. .

OPTICS EXPRESS, 2008, 16 (06) :4154-4162

[10] Far-field optical nanoscopy [J].

Hell, Stefan W. .

SCIENCE, 2007, 316 (5828) :1153-1158

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