Deep Learning-Based Solar-Cell Manufacturing Defect Detection With Complementary Attention Network

被引:153
作者
Su, Binyi [1 ]
Chen, Haiyong [1 ]
Chen, Peng [1 ]
Bian, Guibin [2 ]
Liu, Kun [1 ]
Liu, Weipeng [1 ]
机构
[1] Hebei Univ Technol, Sch Artificial Intelligence & Data Sci, Tianjin 300130, Peoples R China
[2] Chinese Acad Sci, Inst Automat, Beijing 100000, Peoples R China
基金
中国国家自然科学基金;
关键词
Photovoltaic cells; Feature extraction; Proposals; Task analysis; Shape; Convolution; Visualization; Attention network; automatic defects detection; near-infrared image; region proposal network (RPN); solar cell; CLASSIFICATION;
D O I
10.1109/TII.2020.3008021
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The automatic defects detection for solar cell electroluminescence (EL) images is a challenging task, due to the similarity of defect features and complex background features. To address this problem, in this article a novel complementary attention network (CAN) is designed by connecting the novel channel-wise attention subnetwork with spatial attention subnetwork sequentially, which adaptively suppresses the background noise features and highlights the defect features simultaneously by employing the complementary advantage of the channel features and spatial position features. In CAN, the novel channel-wise attention subnetwork applies convolution operation to integrate the concatenated and discriminative output features extracted by global average pooling layer and global max pooling layer, which can make fully use of these informative features. Furthermore, a region proposal attention network (RPAN) is proposed by embedding CAN into region proposal network in faster R-CNN (convolution neutral network) to extract more refined defective region proposals, which is used to construct a novel end-to-end faster RPAN-CNN framework for detecting defects in raw EL image. Finally, some experimental results on a large-scale EL dataset including 3629 images, 2129 of which are defective, show that the proposed method performs much better than other methods in terms of defects classification and detection results in raw solar cell EL images.
引用
收藏
页码:4084 / 4095
页数:12
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