Study on the nitridation of β-Ga2O3 films

被引:1
作者
Cheng, Fei [1 ]
Li, Yue-Wen [1 ]
Zhao, Hong [1 ]
Xiu, Xiang-Qian [1 ,2 ]
Jia, Zhi-Tai [2 ]
Liu, Duo [2 ]
Hua, Xue-Mei [1 ]
Xie, Zi-Li [1 ]
Tao, Tao [1 ]
Chen, Peng [1 ]
Liu, Bin [1 ]
Zhang, Rong [1 ]
Zheng, You-Dou [1 ]
机构
[1] Nanjing Univ, Sch Elect Sci & Engn, Key Lab Adv Photon & Elect Mat, Nanjing 210093, Jiangsu, Peoples R China
[2] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Shandong, Peoples R China
关键词
beta-Ga2O3; nitridation; GaN; single-crystal; RAMAN-SCATTERING; HEXAGONAL GAN; DISPERSION; GROWTH; XRD;
D O I
10.1088/1674-1056/28/8/088103
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Single-crystal GaN layers have been obtained by nitriding beta-Ga2O3 films in NH3 atmosphere. The effect of the temperature and time on the nitridation and conversion of Ga2O3 films have been investigated. The nitridation process results in lots of holes in the surface of films. The higher nitridation temperature and longer time can promote the nitridation and improve the crystal quality of GaN films. The converted GaN porous films show the single-crystal structures and low-stress, which can be used as templates for the epitaxial growth of high-quality GaN.
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页数:5
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