Integrating Thermocouple Sensors into 3D ICs

被引:0
作者
Li, Dawei [1 ]
Kim, Ji-Hoon [1 ]
Memik, Seda Ogrenci [1 ]
机构
[1] Northwestern Univ, Dept EECS, Evanston, IL 60208 USA
来源
2013 IEEE 31ST INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD) | 2013年
关键词
3D IC; TSV (through silicon via); thermal monitoring; bi-metallic thermocouple; CHIP;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present a novel architecture for embedding bi-metallic thermocouple based temperature sensors into 3D IC stacks. To the best of our knowledge this is the first work addressing this specific integration problem. Our architecture uses dedicated vias to thermally couple sensors in the metal layer with the hotspots to be monitored in the active layer throughout the multi-stack structures. We propose a low cost solution by leveraging a fraction of existing thermal TSVs for this purpose. Through thermal modeling and simulation using a state-of-the-art tool (FloTHERM), we demonstrate that we can achieve high accuracy (less than 1 degrees C error) in temperature tracking while still maintaining the effectiveness of the thermal TSVs in heat management (conforming to a fixed peak temperature threshold of 95 degrees C).
引用
收藏
页码:221 / 226
页数:6
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